2011 IEEE NSS/MIC/RTSD

We, Acrorad Co., Ltd. will attend NSS/MIC/RTSD conference held on 23 - 29 October 2011 /  Valencia Spain.
We will exhibit at our booth with;

 

CdTe crystals
4 inch Single crystal is now available

 

Radiation detectors
We can provide various shape of detectors upon customers request

photolithography

pixel electrode

pattern on both side

 

2D x-ray imager

Image sample taken by CdTe 2D imager
FOV
Pixel pitch
X-ray condition;
voltage
current
Distance
Acquisition
* without correction
51x46mm
100μm

80kV
80uA
50cm
500m sec

 

High energy detection module

Energy resolution (FWHM) : 1.84% at 622keV