XRD (X-ray Diffractometer)

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Measureable in Hard X-ray Region with High Sensitivity

XRD (X-ray Diffractometer) can do identification of chemical compound and crystal structure analysis through measuring diffraction of X-ray.

Through utilizing our CdTe single crystal semiconductor, high precision measurement is possible even in the hard X-ray region, around 100keV.

硬X線領域でも高精度の測定が可能

DECTRIS

PILATUS3 X CdTe SERIES

硬X線領域でも高精度の測定が可能


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